Title :
Growth and dielectric characterization of `relaxor ferroelectric´ Pb(Mg1/3Nb2/3)O3 single crystals
Author :
Ye, Z.G. ; Rivera, J.P. ; Schmid, H.
Author_Institution :
Dept. de Chimie Miner., Anal. et Appliques, Geneve Univ., Switzerland
Abstract :
Single crystals of the perovskite Pb(Mg1/3Nb2/3 )O3 [PMN] were grown by the high-temperature solution technique, according to an originally established pseudobinary phase diagram between PMN and PbO. The temperature dependence and frequency dependence of the complex dielectric permittivity were measured on thin platelets of different crystallographic sections by means of quasi-continuous frequency scanning from 1 kHz to 10 MHz, at temperatures ranging from 12.5 K to 418 K. The dielectric properties of the PMN platelets are characterized by an intermediate state between relaxation and resonance
Keywords :
crystal growth from solution; ferroelectric materials; lead compounds; permittivity; 1 kHz to 10 MHz; 12.5 to 418 K; PMN; PbMgO3NbO3; complex dielectric permittivity; frequency dependence; intermediate state; relaxor ferroelectric; single crystals; solution growth; temperature dependence; Crystallography; Crystals; Dielectric measurements; Frequency dependence; Frequency measurement; Niobium; Permittivity measurement; Relaxor ferroelectrics; Temperature dependence; Temperature distribution;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200294
