Title :
A Cad-Oriented Physics-Based Two-Dimensional Gaas Fet Noise Model for Mmic Design
Author :
Ghione, G. ; Bonani, F. ; Pirola, M. ; Naldi, C.U.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
Keywords :
FETs; Fluctuations; Frequency; Gallium arsenide; Impedance; MESFETs; MMICs; Noise figure; Solid modeling; Stress;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672186