DocumentCode :
3037
Title :
High-Temperature Die Attachment Using Sn-Plated Zn Solder for Power Electronics
Author :
Sungwon Park ; Nagao, Shijo ; Kato, Yoshitaka ; Ishino, Hiroshi ; Sugiura, Kazuhiko ; Tsuruta, Kazuhiro ; Suganuma, Katsuaki
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
Volume :
5
Issue :
7
fYear :
2015
fDate :
Jul-15
Firstpage :
902
Lastpage :
909
Abstract :
Pure Zn is a Pb-free die-attach material considered suitable for application in high-temperature electronics such as widebandgap semiconductor devices, as it has both the requisite electrical/thermal conductivity and an excellent thermal shock resistance. The high melting point of Zn (419.5 °C), however, means that die-attachment using pure Zn would require higher bonding temperatures (>430 °C), whereas a lower temperature is more desirable for mass production. This paper, therefore, presents a bonding method based on using Sn-plated Zn solder (Sn/Zn/Sn structure) to achieve a lower bonding temperature than pure Zn die attachment. The resulting shear strength of this bonding exceeds 25 MPa at 350 °C for 30 min, which is attributed to a uniform and complete Ni-Zn IMC (γ-Ni5Zn21) reaction layer. Furthermore, this bonding strength is retained beyond 25 MPa without serious degradation, even after thermal shock testing within a temperature range of -50 °C-300 °C; and thus, the Sn-plated Zn solder proposed has great potential as a die-attach material for high-temperature applications such as power devices.
Keywords :
bonding processes; microassembling; nickel alloys; power electronics; shear strength; solders; thermal shock; tin alloys; zinc alloys; Ni-Zn IMC reaction layer; Ni5Zn21; Sn-Zn; Sn-Zn-Sn structure; Sn-plated Zn solder; bonding method; bonding strength; bonding temperature; high-temperature die attachment; power electronics; shear strength; temperature -50 degC to 300 degC; temperature 350 degC; thermal shock testing; time 30 min; Bonding; Electric shock; Microstructure; Nickel; Thermal conductivity; Tin; Zinc; Joining processes; packaging; power semiconductor devices; soldering; soldering.;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2015.2443058
Filename :
7147816
Link To Document :
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