Title :
An exact evaluation of Kirchhoff approximation for backscattering from a one-dimensional rough surface
Author_Institution :
Dept. of Radio Sci. & Eng., Hong-Ik Univ., Seoul, South Korea
Abstract :
The backscattered total intensity is evaluated without using any further approximation and the results are compared with those of the zeroth-order and the first-order approximated physical optics (PO) models. In other words, the exactly evaluated Kirchhoff approximation (KA) solution has been used to examine the effects of the slope terms and the edge term. Since the evaluation of backscattering from a two-dimensional rough surface requires a very long computing time, only one-dimensional rough dielectric and conducting surface is considered. The exactly evaluated KA solution is verified with a moment method (MM) solution for a rough surface.
Keywords :
approximation theory; backscatter; electromagnetic wave scattering; method of moments; physical optics; Kirchhoff approximation; backscattered total intensity; backscattering; conducting surface; dielectric surface; edge term; exact evaluation; first-order approximated PO model; moment method; one-dimensional rough surface; physical optics models; slope terms; zeroth-order approximated PO model; Backscatter; Dielectrics; Kirchhoff´s Law; Optical computing; Optical scattering; Physical optics; Polarization; Rough surfaces; Surface fitting; Surface roughness;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
DOI :
10.1109/APS.1996.549887
