• DocumentCode
    3037000
  • Title

    Advanced interconnect technology

  • Author

    Meindl, J.D.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    3
  • Abstract
    Summary form only given. As minimum feature size in multi-billion transistor chips scales to the 100 nm range and below, the relative importance of transistors and interconnects in determining the maximum clock frequency, power dissipation, size and cost of a chip is changing. Interconnects now tend to surpass transistors in terms of impact on these key chip metrics. This “tyranny” of interconnects can be mitigated by the following approaches: (1) invention of new communication centric architectures; (2) development of new compact models that describe accurately the massive inductive and capacitive coupling that occurs in multilevel interconnect networks; (3) the use of on-chip and chip-to-chip optical interconnects; (4) ultra-high density electrical input/output interconnects and chip packages batch fabricated at the wafer level; (5) three-dimensional structures using multiple levels of transistors and interconnects; and (6) predictive process, property and performance models for interconnects as well as novel metrology tools to support them. These approaches are under investigation in a long-range research program with a ten-year horizon involving six universities, which operate coherently as the Interconnect Focus Center
  • Keywords
    batch processing (industrial); integrated circuit design; integrated circuit interconnections; integrated circuit measurement; integrated circuit metallisation; integrated circuit modelling; integrated circuit packaging; optical interconnections; 100 nm; 3D structures; capacitive coupling; chip cost; chip metrics; chip packages; chip size; chip-to-chip optical interconnects; communication centric architectures; compact models; inductive coupling; interconnect technology; interconnects; maximum clock frequency; metrology tools; minimum feature size; multi-billion transistor chips; multilevel interconnect networks; multiple interconnect levels; multiple transistor levels; on-chip optical interconnects; power dissipation; predictive performance models; predictive process models; predictive property models; transistors; ultra-high density electrical input/output interconnects; wafer level batch fabrication; Clocks; Costs; Frequency; Network-on-a-chip; Optical coupling; Optical interconnections; Power dissipation; Predictive models; Semiconductor device modeling; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
  • Conference_Location
    Tehran
  • Print_ISBN
    964-360-057-2
  • Type

    conf

  • DOI
    10.1109/ICM.2000.916400
  • Filename
    916400