• DocumentCode
    3037560
  • Title

    Fabrication of InP heterostructure bipolar transistors for 40 Gb/s communication systems

  • Author

    Abid, Z.

  • Author_Institution
    Dept. of Electr. Eng., King Saud Univ., Riyadh, Saudi Arabia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    InP heterostructure bipolar transistors (HBT) are known for their high speed and easy integration with optical devices. Its technology is in general still developing. High frequency InP HBTs were fabricated. Some device and layer structure design improvements for 40 Gbit/s communications systems applications are suggested. The necessary conditions to manufacture the devices are presented. Various collector structures are used to increase the breakdown voltage while maintaining speed and gain
  • Keywords
    III-V semiconductors; data communication equipment; heterojunction bipolar transistors; indium compounds; microwave bipolar transistors; semiconductor device breakdown; transceivers; 40 Gbit/s; InP; InP HBT; InP HBT fabrication; InP heterostructure bipolar transistors; breakdown voltage; collector structures; communication systems; communications systems applications; device speed; device structure design; gain; high frequency InP HBTs; layer structure design; optical device integration; Bipolar transistors; Electron mobility; Fabrication; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Photonic band gap; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
  • Conference_Location
    Tehran
  • Print_ISBN
    964-360-057-2
  • Type

    conf

  • DOI
    10.1109/ICM.2000.916430
  • Filename
    916430