Abstract :
The following topics were dealt with: defect and fault tolerance; dependability analysis and evaluation; reliability; error detection and correction; testing.
Keywords :
VLSI; fault tolerance; integrated circuit reliability; testing; VLSI; defect; dependability analysis; error correction; error detection; fault tolerance; reliability; testing;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0
