Title :
The Evolving Role of Test ... it is now a "Value Add" Operation
Abstract :
Summary form only given. This paper will focus on the key trends driving these changes to test and the emerging methods that are enabling test to be a "value add" operation. Industry examples will be shown where test has provided unique insight to IC process performance and defect behavior using these methods.
Keywords :
integrated circuit reliability; integrated circuit testing; IC process; integrated circuit reliability; integrated circuit testing; value add operation; Costs; Fault tolerant systems; Feedback; Integrated circuit testing; Performance loss; Product design; System testing; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0
DOI :
10.1109/DFT.2008.66
