Title :
Growth of BaTiO3 thin films by metallo-organic deposition and rapid thermal annealing under controlled atmosphere
Author :
Shi, Y. ; Sanchez-Carambot, E. ; Martínez-Miranda, L.J. ; Santiago-Avilés, J.J.
Author_Institution :
Moore Sch. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA
Abstract :
In the metallo-organic deposition process, BaTiO3 films were produced by spin casting carefully mixed near-stoichiometric metallo-organic precursors using a photoresist spinner. The substrates used were platinum and low-resistivity (0.002-0.05-Ω-cm) (111)-oriented silicon wafers. Various film thicknesses (0.1-5 μm) were produced by changing spin speeds and by multiple spin casting. Annealing was done by rapid thermal annealing. The films were processed at 950°C for 1 min under atmospheres of O2, Ar, or a partial vacuum of 10-3 torr. The films grown on silicon substrates and processed in partial vacuum showed no formation of BaTiO 3. An impurity phase seemed to appear in all the films grown on silicon. The films grown on platinum showed better purity and crystallinity, and for those processed in Ar or in partial vacuum a certain degree of texture was observed. The films on both platinum and silicon were uniform and showed no cracks when examined by scanning electron microscopy
Keywords :
annealing; barium compounds; ferroelectric thin films; rapid thermal processing; scanning electron microscope examination of materials; stoichiometry; texture; 0.1 to 5 micron; 1.0 min; 10-3 torr; 950 degC; Ar; BaTiO3; O2 atmosphere; Pt; SEM; Si; Si(111) wafers; controlled atmosphere; crystallinity; film thicknesses; growth; impurity phase; metallo-organic deposition process; mixed near-stoichiometric metallo-organic precursors; multiple spin casting; partial vacuum; photoresist spinner; purity; rapid thermal annealing; scanning electron microscopy; spin speeds; texture; thin films; Argon; Atmosphere; Casting; Platinum; Rapid thermal annealing; Rapid thermal processing; Resists; Semiconductor films; Silicon; Substrates;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200357