Title :
Optical characterization of lithium niobate thin films
Author :
Huang, Charles Hung-Jia ; Chui, Herman Chung-Kang ; Stone, Barbara A. ; Rost, Timothy A. ; Rabson, Thomas A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
Abstract :
Optical waveguiding thin films of lithium niobate were RF sputtered onto single-crystal sapphire substrates. A polarized He-Ne laser light with a wavelength of 6328 Å was successfully fed into the optical waveguide by a rutile prism coupler. The guided modes excited by the prism coupler were observed and used to examine the optical properties of the waveguide. The effective thickness and the refractive index for transverse electric and transverse magnetic modes were calculated. The birefringence observed in the films and X-ray diffraction studies have confirmed the polycrystalline nature of the films. The attenuation of the light propagation in the waveguide was determined to be 1.2±0.1 dB/cm
Keywords :
X-ray diffraction examination of materials; birefringence; ferroelectric thin films; light absorption; light propagation; lithium compounds; optical films; optical waveguides; refractive index; sputtered coatings; 6328 Å; Al2O3; LiNbO3; RF sputtered films; TiO2; X-ray diffraction; attenuation; birefringence; effective thickness; excited guided modes; light propagation; optical properties; optical waveguiding thin films; polarized He-Ne laser light; polycrystalline nature; refractive index; rutile prism coupler; single-crystal sapphire substrates; transverse electric modes; transverse magnetic modes; wavelength; Lithium niobate; Magnetic films; Optical attenuators; Optical coupling; Optical films; Optical refraction; Optical variables control; Optical waveguides; Radio frequency; Sputtering;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200359