System Reliabilities When Using Triple Modular Redundancy in Quantum-Dot Cellular Automata

Author

Dysart, Timothy J. ; Kogge, Peter M.

Author_Institution

Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN

fYear

2008

fDate

1-3 Oct. 2008

Firstpage

72

Lastpage

80

Abstract

Nanoelectronic systems are extremely likely to demonstrate high defect and fault rates. As a result, defect and/or fault tolerance may be necessary at several levels throughout the system. Methods for improving defect tolerance, in order to prevent faults, at the component level for QCA have been studied. However, methods and results considering fault tolerance in QCA have received less attention. In this paper, we present an analysis of how QCA system reliability may be impacted by using various triple modular redundancy schemes.

Keywords

cellular automata; combinational circuits; integrated circuit reliability; nanoelectronics; quantum dots; reconfigurable architectures; nanoelectronic systems; quantum-dot cellular automata; system reliabilities; triple modular redundancy; Circuit faults; Electrostatics; Fault tolerance; Fault tolerant systems; Manufacturing processes; Quantum cellular automata; Quantum dots; Redundancy; Reliability; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on

Conference_Location

Boston, MA

ISSN

1550-5774

Print_ISBN

978-0-7695-3365-0

Type

conf

DOI

10.1109/DFT.2008.25

Filename

4641159