Error Detection and Tolerance for Scaled Electronic Technologies

This talk will summarize our design for reliability initiatives that anticipate the paradigm shift to error-aware and error-tolerant design of integrated circuits, both of which are required to address the problem of increasing hardware failures in future technology nodes. These concerns are only exacerbated as we look forward to emerging technology alternatives. Using graphene as an example, I will go on to describe the modeling, simulation, and design challenges that we believe are key to taming the complexity challenges associated with such scaled electronic technologies.