Title :
A Fault Tolerance Aware Synthesis Methodology for Threshold Logic Gate Networks
Author :
Goparaju, Manoj Kumar ; Palaniswamy, Ashok Kumar ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
Abstract :
Threshold logic technology is conceived as the crucial alternate emerging technology to CMOS implementation in nanoelectronic era. The gate that is implemented with threshold logic is called a threshold logic gate (TLG). Threshold gates are very fast and implement complex functionalities thus reducing the logic levels in the circuit implementation. Extensive research has been done in the development of suitable synthesis methodologies in the past, predominantly greedy. In this work, a synthesis methodology is proposed for increased fault tolerance. Experimental results demonstrate the effectiveness of the proposed method both in terms of resulting TLG count in the network implementation and reliability.
Keywords :
CMOS logic circuits; circuit reliability; fault tolerance; logic gates; CMOS implementation; fault tolerance aware synthesis methodology; nanoelectronic; network reliability; threshold logic gate network; threshold logic technology; CMOS logic circuits; CMOS technology; Circuit synthesis; Fault tolerance; Fault tolerant systems; HEMTs; Logic circuits; Logic gates; MODFETs; Network synthesis; Fault tolerance; Synthesis; Threshold logic;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0
DOI :
10.1109/DFT.2008.44