DocumentCode :
3038285
Title :
Logic Circuits Operating in Subthreshold Voltages
Author :
Nyathi, Jabulani ; Bero, Brent
Author_Institution :
Sch. of EECS, Washington State Univ., Pullman, WA
fYear :
2006
fDate :
4-6 Oct. 2006
Firstpage :
131
Lastpage :
134
Abstract :
In this paper different logic circuit families operating in the subthreshold region are analyzed. Their performance in terms of power and speed are of particular interest. The study complements existing work that has reported static CMOS circuit performance under different body biasing schemes in the subthreshold region. Further it offers assurances on noise margins with scaling going beyond the 100 nm technology node. Simulations have been performed at the 180 nm technology node using a 6 metal layer TSMC process. A tunable body biasing scheme that allows bulk CMOS circuits to operate efficiently at subthreshold as well as above threshold voltages is introduced. The scheme improves a five-stage NAND ring oscillator switching speed 6times better than the static CMOS configuration while dissipating 18% less power
Keywords :
CMOS logic circuits; NAND circuits; logic circuits; logic design; low-power electronics; 100 nm; 180 nm; NAND ring oscillator; logic circuits; noise margins; static CMOS circuit performance; subthreshold voltages; tunable body biasing scheme; CMOS technology; Circuit noise; Circuit simulation; Leakage current; Logic circuits; Logic design; Logic devices; MOS devices; Threshold voltage; Tunable circuits and devices; Design; Performance; Subthreshold; Theory; body biasing; logic styles; medium-to-high speed; noise margins; off current; ultra-low power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2006. ISLPED'06. Proceedings of the 2006 International Symposium on
Conference_Location :
Tegernsee
Print_ISBN :
1-59593-462-6
Type :
conf
DOI :
10.1109/LPE.2006.4271821
Filename :
4271821
Link To Document :
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