Title :
A new failure analysis approach to predict and localize defects and weakness areas in trough-glass-vias for a multifunctional package level camera
Author :
El Amrani, A. ; Bouya, Mohsine ; Bouissa, Y. ; Benali, Abderraouf ; Faqir, M. ; Ghogho, Mounir ; Hadjoudja, A. ; Hlou, Laamari
Author_Institution :
Technopolis Rabat-Shore, Int. Univ. of Rabat-UIR, Sala el Jadida, Morocco
Abstract :
In this paper, we provide a novel approach to identify failures and defects that occur in the glass interposer of a system-on-package technology-based miniaturized multifunctional camera. First, we use simulations to validate the proposed defect prediction and/or weakness identification techniques. Then, we confirm the predictions using non-destructive failure analysis techniques. Finally, we use the physical analysis techniques to confirm the software failure mode assumptions.
Keywords :
cameras; failure analysis; glass; system-on-package; vias; defect localization; defect prediction; failure analysis approach; failure identification; glass interposer; miniaturized multifunctional camera; multifunctional package level camera; nondestructive failure analysis technique; physical analysis technique; software failure mode; system-on-package technology; trough-glass-vias; weakness identification technique; Decision support systems; Failure analysis; Integrated circuits;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1241-4
DOI :
10.1109/IPFA.2013.6599196