• DocumentCode
    3038393
  • Title

    Design and fabrication of high accuracy GaAs Hall effect sensor grown by molecular beam epitaxy

  • Author

    Mohades-Kassai, A. ; Soufi, H.R.

  • Author_Institution
    Electron. Res. Center, Iran Univ. of Sci. & Technol., Tehran, Iran
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    A thin GaAs Hall effect sensor with good thermal stability has been grown by molecular beam epitaxy (MBE). This sensor transduces magnetic flux to a voltage signal. The Hall effect involves passing a current through a layer of semiconductor when a magnetic field is applied perpendicularly to the surface of the layer; a voltage is developed across the sides of the semiconductor which is directly proportional to the applied magnetic field. In order to meet the entire requirement of correct measurement and minimize errors, the GaAs layer was cut into a clover-leaf shape by means of a fine-nozzle sandblaster. The ohmic contacts were then formed by sintering indium into the GaAs layer in the presence of HCl gas
  • Keywords
    Hall effect transducers; III-V semiconductors; electric sensing devices; gallium arsenide; magnetic flux; magnetic sensors; molecular beam epitaxial growth; ohmic contacts; semiconductor growth; sintering; thermal stability; GaAs; GaAs Hall effect sensor; GaAs layer cutting; GaAs:In; HCl; HCl gas sintering atmosphere; Hall effect; In sintering; MBE; applied magnetic field; clover-leaf shape; current; design; error minimization; fine-nozzle sandblaster; magnetic flux; measurement accuracy; molecular beam epitaxy; ohmic contacts were; semiconductor layer; semiconductor voltage; thermal stability; thin GaAs Hall effect sensor; voltage signal; Fabrication; Gallium arsenide; Hall effect devices; Magnetic field measurement; Magnetic flux; Magnetic sensors; Molecular beam epitaxial growth; Shape measurement; Thermal stability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
  • Conference_Location
    Tehran
  • Print_ISBN
    964-360-057-2
  • Type

    conf

  • DOI
    10.1109/ICM.2000.916474
  • Filename
    916474