DocumentCode
3038445
Title
Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
fYear
1999
fDate
9-10 Aug. 1999
Abstract
The following topics were dealt with: low power SRAMs; memory architecture and applications; diagnosis and yield; memory testing; SDRAMs; new ideas in technology and design
Keywords
DRAM chips; SRAM chips; integrated circuit design; integrated circuit testing; low-power electronics; memory architecture; SDRAMs; diagnosis; low power SRAMs; memory architecture; memory design; memory technology; memory testing; yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
Conference_Location
San Jose, CA, USA
ISSN
1087-4852
Print_ISBN
0-7695-0259-8
Type
conf
DOI
10.1109/MTDT.1999.782676
Filename
782676
Link To Document