Title :
Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
Abstract :
The following topics were dealt with: low power SRAMs; memory architecture and applications; diagnosis and yield; memory testing; SDRAMs; new ideas in technology and design
Keywords :
DRAM chips; SRAM chips; integrated circuit design; integrated circuit testing; low-power electronics; memory architecture; SDRAMs; diagnosis; low power SRAMs; memory architecture; memory design; memory technology; memory testing; yield;
Conference_Titel :
Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-0259-8
DOI :
10.1109/MTDT.1999.782676
