DocumentCode :
3038445
Title :
Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
fYear :
1999
fDate :
9-10 Aug. 1999
Abstract :
The following topics were dealt with: low power SRAMs; memory architecture and applications; diagnosis and yield; memory testing; SDRAMs; new ideas in technology and design
Keywords :
DRAM chips; SRAM chips; integrated circuit design; integrated circuit testing; low-power electronics; memory architecture; SDRAMs; diagnosis; low power SRAMs; memory architecture; memory design; memory technology; memory testing; yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
ISSN :
1087-4852
Print_ISBN :
0-7695-0259-8
Type :
conf
DOI :
10.1109/MTDT.1999.782676
Filename :
782676
Link To Document :
بازگشت