DocumentCode :
3038614
Title :
Arbitrary Error Detection in Combinational Circuits by Using Partitioning
Author :
Keren, Osnat ; Levin, Ilya ; Ostrovsky, Vladimir ; Abramov, Beni
Author_Institution :
Bar-Han Univ., Ramat Gan
fYear :
2008
fDate :
1-3 Oct. 2008
Firstpage :
361
Lastpage :
369
Abstract :
The paper presents a new technique for designing a concurrently checking combinational circuit. The technique is based on partitioning the circuit into two independent sub-circuits. It does not require any redundant coding variables; instead, it utilizes a sub-set of input variables. These variables are transferred directly into a checker providing the arbitrary error detection. The paper develops and studies a method for selecting an optimized sub-set of such variables. Benchmark results show efficiency of the proposed approach.
Keywords :
combinational circuits; error detection; arbitrary error detection; combinational circuits; optimized sub-set; partitioning; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault tolerant systems; Input variables; Logic; Redundancy; Very large scale integration; combinational circuits; error detection; on-line checking; partitioning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1550-5774
Print_ISBN :
978-0-7695-3365-0
Type :
conf
DOI :
10.1109/DFT.2008.34
Filename :
4641192
Link To Document :
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