DocumentCode :
3038692
Title :
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
Author :
Yang, Fan ; Chakravarty, Sreejit ; Devta-Prasanna, Narendra ; Reddy, Sudhakar M. ; Pomeranz, Irith
Author_Institution :
ECE Dept., Univ. of Iowa, Iowa City, IA
fYear :
2008
fDate :
1-3 Oct. 2008
Firstpage :
394
Lastpage :
402
Abstract :
In many designs asynchronous inputs are used to set and/or reset flip-flops. Considering a scan cell implementation used in an industrial design we show that stuck-open faults in some transistors driven by asynchronous inputs require two new flush tests. Such faults, if left undetected, cause functional failures. The two new tests increase the overall stuck-open fault coverage of each scan cell by approximately 5%. This will significantly improve the overall test quality due to the large number of scan cells contained in large industrial designs.
Keywords :
VLSI; fault diagnosis; flip-flops; industrial designs; reset flip-flops; scan cells; stuck-open fault coverage; stuck-open faults; transistor stuck-open faults; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Fault detection; Flip-flops; Logic testing; Tellurium; USA Councils; Very large scale integration; asynchronous inputs; internal faults; scan cells; scan chain; stuck-open fault;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1550-5774
Print_ISBN :
978-0-7695-3365-0
Type :
conf
DOI :
10.1109/DFT.2008.11
Filename :
4641196
Link To Document :
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