• DocumentCode
    3038760
  • Title

    Low-power SRAM circuit design

  • Author

    Margala, Martin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    115
  • Lastpage
    122
  • Abstract
    This paper presents an extensive summary of the latest developments in low-power circuit techniques and methods for Static Random Access Memories. The key techniques in power reduction in both active and standby modes are: capacitance reduction by using divided word-line structure or single-bitline cross-point cell activation, pulse operation by using ATD generator and reduced signal swings on high-capacitance predecode lines, write bus lines and datalines, AC current reduction by using multistage decoding, operating voltage reduction coupled with low-power sensing by using charge-transfer amplification, step-down boosted word-line scheme or full current-mode read/write operation and leakage current suppression by using dual-Vt, Auto-Backgate-Controlled multiple-Vt, or dynamic leakage cut-off techniques
  • Keywords
    CMOS memory circuits; SRAM chips; capacitance; integrated circuit design; leakage currents; low-power electronics; memory architecture; AC current reduction; ATD generator; active mode; auto-backgate controlled CMOS; capacitance reduction; charge-transfer amplification; datalines; divided word-line structure; dynamic leakage cut-off techniques; full current-mode read/write operation; high-capacitance predecode lines; leakage current suppression; low-power SRAM circuit design; low-power sensing; multistage decoding; operating voltage reduction; power reduction; pulse operation; reduced signal swings; single-bitline cross-point cell activation; standby mode; static random access memories; step-down boosted word-line scheme; write bus lines; AC generators; Capacitance; Circuit synthesis; Power generation; Pulse amplifiers; Pulse generation; Random access memory; SRAM chips; Signal generators; Standby generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
  • Conference_Location
    San Jose, CA
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-0259-8
  • Type

    conf

  • DOI
    10.1109/MTDT.1999.782692
  • Filename
    782692