DocumentCode :
3038760
Title :
Low-power SRAM circuit design
Author :
Margala, Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
fYear :
1999
fDate :
1999
Firstpage :
115
Lastpage :
122
Abstract :
This paper presents an extensive summary of the latest developments in low-power circuit techniques and methods for Static Random Access Memories. The key techniques in power reduction in both active and standby modes are: capacitance reduction by using divided word-line structure or single-bitline cross-point cell activation, pulse operation by using ATD generator and reduced signal swings on high-capacitance predecode lines, write bus lines and datalines, AC current reduction by using multistage decoding, operating voltage reduction coupled with low-power sensing by using charge-transfer amplification, step-down boosted word-line scheme or full current-mode read/write operation and leakage current suppression by using dual-Vt, Auto-Backgate-Controlled multiple-Vt, or dynamic leakage cut-off techniques
Keywords :
CMOS memory circuits; SRAM chips; capacitance; integrated circuit design; leakage currents; low-power electronics; memory architecture; AC current reduction; ATD generator; active mode; auto-backgate controlled CMOS; capacitance reduction; charge-transfer amplification; datalines; divided word-line structure; dynamic leakage cut-off techniques; full current-mode read/write operation; high-capacitance predecode lines; leakage current suppression; low-power SRAM circuit design; low-power sensing; multistage decoding; operating voltage reduction; power reduction; pulse operation; reduced signal swings; single-bitline cross-point cell activation; standby mode; static random access memories; step-down boosted word-line scheme; write bus lines; AC generators; Capacitance; Circuit synthesis; Power generation; Pulse amplifiers; Pulse generation; Random access memory; SRAM chips; Signal generators; Standby generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
Conference_Location :
San Jose, CA
ISSN :
1087-4852
Print_ISBN :
0-7695-0259-8
Type :
conf
DOI :
10.1109/MTDT.1999.782692
Filename :
782692
Link To Document :
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