• DocumentCode
    3038849
  • Title

    Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller

  • Author

    Maniatakos, Michail ; Karimi, Naghmeh ; Makris, Yiorgos ; Jas, Abhijit ; Tirumurti, Chandra

  • Author_Institution
    EE Dept., Yale Univ., New Haven, CT
  • fYear
    2008
  • fDate
    1-3 Oct. 2008
  • Firstpage
    454
  • Lastpage
    462
  • Abstract
    This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction executing in the processor. To evaluate the proposed method, we use a superscalar, dynamically-scheduled, out-of-order, Alpha-like microprocessor, on which we execute SPEC2000 integer benchmarks and we consider the coverage and the detection latency for faults in the scheduler module of the microprocessor controller. Experimental results show that through this method, a large percentage of control logic faults can be detected with low latency during normal operation of the processor.
  • Keywords
    combinational circuits; error detection; logic design; microcomputers; control logic faults; detection latency; microprocessor controller; timestamp-based concurrent error detection method; Circuit faults; Control systems; Costs; Delay; Error correction; Fault detection; Logic testing; Microprocessors; Monitoring; Processor scheduling; Concurrent Error Detection; Microprocessor Controller;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3365-0
  • Type

    conf

  • DOI
    10.1109/DFT.2008.59
  • Filename
    4641203