DocumentCode
3038849
Title
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller
Author
Maniatakos, Michail ; Karimi, Naghmeh ; Makris, Yiorgos ; Jas, Abhijit ; Tirumurti, Chandra
Author_Institution
EE Dept., Yale Univ., New Haven, CT
fYear
2008
fDate
1-3 Oct. 2008
Firstpage
454
Lastpage
462
Abstract
This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction executing in the processor. To evaluate the proposed method, we use a superscalar, dynamically-scheduled, out-of-order, Alpha-like microprocessor, on which we execute SPEC2000 integer benchmarks and we consider the coverage and the detection latency for faults in the scheduler module of the microprocessor controller. Experimental results show that through this method, a large percentage of control logic faults can be detected with low latency during normal operation of the processor.
Keywords
combinational circuits; error detection; logic design; microcomputers; control logic faults; detection latency; microprocessor controller; timestamp-based concurrent error detection method; Circuit faults; Control systems; Costs; Delay; Error correction; Fault detection; Logic testing; Microprocessors; Monitoring; Processor scheduling; Concurrent Error Detection; Microprocessor Controller;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
978-0-7695-3365-0
Type
conf
DOI
10.1109/DFT.2008.59
Filename
4641203
Link To Document