DocumentCode :
3038992
Title :
A Tile-Based Error Model for Forward Growth of DNA Self-Assembly
Author :
Hashempour, Masoud ; Arani, Z.M. ; Lombardi, Fabrizio
Author_Institution :
Dept. of ECE, Northeastern Univ., Boston, MA
fYear :
2008
fDate :
1-3 Oct. 2008
Firstpage :
516
Lastpage :
524
Abstract :
This paper deals with the error tolerance of forward growth for DNA self-assembly. A model based on a single tile attachment is proposed. This model captures the features of the so-called corner attachment by considering the binding of the bonds between a tile and the current error-free aggregate. An analysis of this process and its implications on possible errors due to single and double mismatches are pursued. It is shown that an attachment in forward growth may result in mismatches by considering the label set of each tile and ensuring its possible existence with respect to an aggregate. The bounds (lower and upper) on the cardinality of a label set for DNA self-assembly, are proven. The proposed model is used to assess the error tolerance of different tile sets with and without block redundancy (such as proofreading).
Keywords :
microassembling; nanofabrication; self-assembly; DNA self-assembly; corner attachment; current error-free aggregate; error tolerance; forward growth; nanofabrication; single tile attachment; tile-based error model; Aggregates; Assembly; DNA; Error analysis; Error correction; Image edge detection; Manufacturing; Redundancy; Self-assembly; Tiles; DNA Self-assembly; Error Tolerance; Growth; Nano Manufacturing; Tiling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1550-5774
Print_ISBN :
978-0-7695-3365-0
Type :
conf
DOI :
10.1109/DFT.2008.15
Filename :
4641211
Link To Document :
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