• DocumentCode
    3039004
  • Title

    Checkpointing of Rectilinear Growth in DNA Self-Assembly

  • Author

    Frechette, S. ; Kim, Y.B. ; Lombardi, F.

  • Author_Institution
    Riverside Res. Inst., Lexington, MA
  • fYear
    2008
  • fDate
    1-3 Oct. 2008
  • Firstpage
    525
  • Lastpage
    533
  • Abstract
    Error detection/correction techniques have been advocated for algorithmic self-assembly. Under rectilinear growth, it requires only two additional tiles, generally referred to as Isolation tiles. This process can be effectively utilized for checkpointing and is analyzed in this paper self-assembly. Initially, the physical framework (and related features) for the removal of the erroneous sections of an assembly is outlined. A novel Markov based model is presented to establish the optimal rate of checkpointing and assess its performance versus other error tolerant techniques that utilize redundancy. Simulation results are provided.
  • Keywords
    DNA; Markov processes; error correction; error detection; microassembling; nanolithography; self-assembly; DNA self-assembly; Markov based model; error detection-correction techniques; error tolerant techniques; nanolithography; rectilinear growth checkpointing; Assembly; Bonding; Checkpointing; DNA; Error analysis; Error correction; Redundancy; Self-assembly; Temperature; Tiles; DNA self-assembly; checkpointing; error tolerance; tiling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3365-0
  • Type

    conf

  • DOI
    10.1109/DFT.2008.10
  • Filename
    4641212