DocumentCode
3039004
Title
Checkpointing of Rectilinear Growth in DNA Self-Assembly
Author
Frechette, S. ; Kim, Y.B. ; Lombardi, F.
Author_Institution
Riverside Res. Inst., Lexington, MA
fYear
2008
fDate
1-3 Oct. 2008
Firstpage
525
Lastpage
533
Abstract
Error detection/correction techniques have been advocated for algorithmic self-assembly. Under rectilinear growth, it requires only two additional tiles, generally referred to as Isolation tiles. This process can be effectively utilized for checkpointing and is analyzed in this paper self-assembly. Initially, the physical framework (and related features) for the removal of the erroneous sections of an assembly is outlined. A novel Markov based model is presented to establish the optimal rate of checkpointing and assess its performance versus other error tolerant techniques that utilize redundancy. Simulation results are provided.
Keywords
DNA; Markov processes; error correction; error detection; microassembling; nanolithography; self-assembly; DNA self-assembly; Markov based model; error detection-correction techniques; error tolerant techniques; nanolithography; rectilinear growth checkpointing; Assembly; Bonding; Checkpointing; DNA; Error analysis; Error correction; Redundancy; Self-assembly; Temperature; Tiles; DNA self-assembly; checkpointing; error tolerance; tiling;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
978-0-7695-3365-0
Type
conf
DOI
10.1109/DFT.2008.10
Filename
4641212
Link To Document