DocumentCode :
3039019
Title :
Effects of Cu-dopant on properties of CdTe thin films
Author :
Ji, Zhenguo ; Wang, Guochang ; Xi, Junhua
Author_Institution :
Coll. of Mater. & Environ. Eng., Hangzhou Dianzi Univ., Hangzhou, China
fYear :
2011
fDate :
26-28 July 2011
Firstpage :
5822
Lastpage :
5824
Abstract :
Polycrystalline CdTe films were deposited on glass substrates by RF magnetron sputtering. The structural, optical and electrical properties of the CdTe films and Cu doping effects on the properties of the CdTe films have been investigated by means of X-ray diffraction, UV-Vis Spectroscopy, and Hall effect measurement.
Keywords :
Hall effect; II-VI semiconductors; X-ray diffraction; cadmium compounds; copper; semiconductor thin films; sputter deposition; ultraviolet spectra; visible spectra; CdTe:Cu; Hall effect measurement; RF magnetron sputtering; UV-Vis Spectroscopy; X-ray diffraction; doping effects; electrical property; glass substrates; optical property; structural property; thin films; Copper; Optical films; Photovoltaic cells; Sputtering; X-ray scattering; CdTe; Cu doping; RF magnetron sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia Technology (ICMT), 2011 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-61284-771-9
Type :
conf
DOI :
10.1109/ICMT.2011.6002513
Filename :
6002513
Link To Document :
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