Fabrication Variations and Defect Tolerance for Nanomagnet-Based QCA

Author

Niemier, Michael ; Crocker, Michael ; Hu, X. Sharon

Author_Institution

Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN

fYear

2008

fDate

1-3 Oct. 2008

Firstpage

534

Lastpage

542

Abstract

Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations and defects might lead to faulty behavior in Magnetic Quantum-dot Cellular Automata (MQCA) circuits and systems. Here, we leverage physical-level simulation to consider how fabrication variations might affect a circuit´s logical correctness. We then discuss how we can tolerate fabrication variations at the device, circuit, and architectural level.

Keywords

cellular automata; logic design; nanoelectronics; quantum dots; quantum gates; architectural level; defect tolerance; fabrication variations; faulty behavior; logical correctness; magnetic quantum-dot cellular automata circuits; nanomagnet-based QCA; nanometer feature sizes; physical-level simulation; Antiferromagnetic materials; CMOS process; Circuit faults; Fabrication; Magnets; Nanoscale devices; Quantum cellular automata; Quantum dots; Stationary state; Wire; QCA; defect; fault; nanomagnets; tolerance;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on

Conference_Location

Boston, MA

ISSN

1550-5774

Print_ISBN

978-0-7695-3365-0

Type

conf

DOI

10.1109/DFT.2008.54

Filename

4641213