DocumentCode :
3039100
Title :
A New Technique for Jointly Optimizing Gate Sizing and Supply Voltage in Ultra-Low Energy Circuits
Author :
Hanson, Scott ; Sylvester, Dennis ; Blaauw, David
Author_Institution :
Michigan Univ., Ann Arbor, MI
fYear :
2006
fDate :
4-6 Oct. 2006
Firstpage :
338
Lastpage :
341
Abstract :
Mobile applications with battery lifetimes on the order of thousands of days have placed stringent energy requirements on circuits. In this paper, we propose a new energy optimization technique for ultra-low energy circuits operating in the sub threshold regime. Our technique uses simultaneous gate sizing and supply voltage scaling to reduce energy. We demonstrate the effectiveness of our technique on benchmark circuits and offer insight on the roles of the timing distribution and wire capacitance in determining the achievable energy reductions
Keywords :
capacitance; circuit optimisation; integrated circuit design; low-power electronics; mobile computing; scaling circuits; battery lifetimes; benchmark circuits; energy optimization technique; gate sizing; mobile applications; sub threshold circuits; supply voltage; timing distribution; ultra low energy circuits; voltage scaling; wire capacitance; Batteries; Circuits; Delay; Design optimization; Dynamic voltage scaling; Energy efficiency; Inverters; Low voltage; Minimization; Timing; Algorithms; Design; Performance; Subthreshold circuits; gate sizing; voltage scaling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2006. ISLPED'06. Proceedings of the 2006 International Symposium on
Conference_Location :
Tegernsee
Print_ISBN :
1-59593-462-6
Type :
conf
DOI :
10.1109/LPE.2006.4271861
Filename :
4271861
Link To Document :
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