Title :
A hidden Markov model-based algorithm for online fault diagnosis with partial and imperfect tests
Author :
Ying, Jie ; Kirubarajan, T. ; Pattipati, Krishna R.
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
Abstract :
Presents a hidden Markov model (HMM) based algorithm for online fault diagnosis in complex large-scale systems with partial and imperfect tests. The HMM-based algorithm handles test uncertainties and inaccuracies, finds the best estimate of system states and identifies the dynamic changes in system states, such as from a fault-free state to a faulty one. We also present two methods to estimate the model parameters, namely the state transition probabilities and the instantaneous probabilities of observed test outcomes, for adaptive fault diagnosis. In order to validate the adaptive parameter estimation techniques, we present simulation results with and without the knowledge of HMM parameters. In addition, the advantages of using the HMM approach over a Hamming-distance based fault diagnosis technique are quantified. Tradeoffs in complexity versus performance of the diagnostic algorithm are discussed
Keywords :
diagnostic reasoning; fault diagnosis; hidden Markov models; large-scale systems; online operation; parameter estimation; state estimation; uncertain systems; Hamming distance; adaptive fault diagnosis; complex large-scale systems; complexity; dynamic system state changes; fault-free state; faulty state; hidden Markov model-based algorithm; imperfect tests; instantaneous probabilities; model parameter estimation; observed test outcomes; online fault diagnosis; partial tests; performance; state transition probabilities; system state estimation; test inaccuracies; test uncertainties; Fault diagnosis; Hidden Markov models; Intelligent sensors; Large-scale systems; Parameter estimation; Sensor systems; Signal sampling; State estimation; System testing; Uncertainty;
Conference_Titel :
Soft Computing Methods in Industrial Applications, 1999. SMCia/99. Proceedings of the 1999 IEEE Midnight-Sun Workshop on
Conference_Location :
Kuusamo
Print_ISBN :
0-7803-5280-7
DOI :
10.1109/SMCIA.1999.782716