• DocumentCode
    3039226
  • Title

    Resonant-tunneling-diode loads: speed limits and applications in fast logic circuits

  • Author

    Brown, E.R. ; Hollis, M.A. ; Smith, F.W. ; Wang, K.-C. ; Asbeck, P.M.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • fYear
    1992
  • fDate
    19-21 Feb. 1992
  • Firstpage
    142
  • Lastpage
    143
  • Abstract
    It is shown that the high-speed and negative-resistance properties of the resonant tunneling diode (RTD) can improve the performance of some common inverters by greatly reducing the static power dissipation while affecting the dynamic properties to a much lesser extent. InGaAs RTDs with a peak-to-valley ratio of 12 at room temperature can switch in approximately 2 ps and, therefore, are useful as negative resistance loads for heterostructure transistors in digital circuits HFET-RTD and HBT-RTD inverter have been simulated using SPICE. The switching of the 1.0 mu m-gate-length HFT-RTD inverter is greater than that of the E-D HFET (heterostructure FET) inverter by over a factor of two, and static power is lower by a factor of five. A similar contrast is found between HBT-RTD and conventional HBT-I/sup 2/L (integrated injection logic) inverters.<>
  • Keywords
    III-V semiconductors; SPICE; circuit CAD; gallium arsenide; indium compounds; integrated logic circuits; invertors; logic CAD; negative resistance; resonant tunnelling devices; tunnel diodes; 1.0 micron; 2 ps; HBT-RTD; HFET-RTD; InGaAs; SPICE; digital circuits; fast logic circuits; heterostructure transistors; inverters; negative-resistance properties; peak-to-valley ratio; resonant tunneling diode; speed limits; static power dissipation; Diodes; HEMTs; Indium gallium arsenide; MODFETs; Power dissipation; Pulse inverters; Resonant tunneling devices; Switches; Switching circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1992. Digest of Technical Papers. 39th ISSCC, 1992 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0573-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.1992.200452
  • Filename
    200452