DocumentCode
3039277
Title
The effect of Pb contamination on the solidification behaviors and mechanical properties of backward compatible solder joints
Author
Li Xunping ; Zhou Bin ; En YunFei ; He Xiaoqi ; Wei Xiongfeng
Author_Institution
5th Electron. Res. Inst., Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Minist. of Inf. Ind., Guangzhou, China
fYear
2013
fDate
15-19 July 2013
Firstpage
628
Lastpage
632
Abstract
The Pb contamination on the solidification behaviors and shear properties of Backward Compatible solder joints were investigated. The solidification behavior of solder and joint examined by using a DSC instrument, and it was found that the addition of Pb in Sn3.0Ag0.5Cu would change the primary phase during solidification and change the microstructure of backward compatible solder and joint, meantime, it is easy form a low melting temperature Sn-Ag-Pb ternary eutectic alloy, and the pasty rang between two endothermic(or exothermic) peak decreases with the increasing of Pb content in solder matrix. The discrepancy in solidification behavior results in different microstructures significantly. The average sizes of β-Sn and IMC particles(Ag3Sn and Cu6Sn5) in solder matrix are larger than those in Sn3.0Ag0.5Cu solder relatively. However, the shear force of backward compatible mixed joints is higher than SAC/Cu joint independent of Pb content when Pb content in solder matrix is less than 30 wt.% by using ball shear test, it seems that the low melting temperature Sn-Ag-Pb has little influence on the shear properties of mixed joints with a single interface in as-solidified condition. The addition of Pb in Sn3.0Ag0.5Cu solder apparently facilitated the slip of β-Sn and stress release under shear stress to some extent.
Keywords
copper alloys; differential scanning calorimetry; eutectic alloys; shearing; silver alloys; solders; solidification; tin alloys; Ag3Sn; Cu6Sn5; DSC instrument; Pb; Sn-Ag-Pb; Sn3.0Ag0.5Cu; backward compatible solder joints; differential scanning calorimetry; lead contamination; low melting temperature; shear stress; solder matrix; solidification; ternary eutectic alloy; Contamination; Joints; Lead; Microstructure; Reliability; Soldering; backward compatible; shear properties; solder joint; solidification behavior;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location
Suzhou
ISSN
1946-1542
Print_ISBN
978-1-4799-1241-4
Type
conf
DOI
10.1109/IPFA.2013.6599239
Filename
6599239
Link To Document