• DocumentCode
    3039277
  • Title

    The effect of Pb contamination on the solidification behaviors and mechanical properties of backward compatible solder joints

  • Author

    Li Xunping ; Zhou Bin ; En YunFei ; He Xiaoqi ; Wei Xiongfeng

  • Author_Institution
    5th Electron. Res. Inst., Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Minist. of Inf. Ind., Guangzhou, China
  • fYear
    2013
  • fDate
    15-19 July 2013
  • Firstpage
    628
  • Lastpage
    632
  • Abstract
    The Pb contamination on the solidification behaviors and shear properties of Backward Compatible solder joints were investigated. The solidification behavior of solder and joint examined by using a DSC instrument, and it was found that the addition of Pb in Sn3.0Ag0.5Cu would change the primary phase during solidification and change the microstructure of backward compatible solder and joint, meantime, it is easy form a low melting temperature Sn-Ag-Pb ternary eutectic alloy, and the pasty rang between two endothermic(or exothermic) peak decreases with the increasing of Pb content in solder matrix. The discrepancy in solidification behavior results in different microstructures significantly. The average sizes of β-Sn and IMC particles(Ag3Sn and Cu6Sn5) in solder matrix are larger than those in Sn3.0Ag0.5Cu solder relatively. However, the shear force of backward compatible mixed joints is higher than SAC/Cu joint independent of Pb content when Pb content in solder matrix is less than 30 wt.% by using ball shear test, it seems that the low melting temperature Sn-Ag-Pb has little influence on the shear properties of mixed joints with a single interface in as-solidified condition. The addition of Pb in Sn3.0Ag0.5Cu solder apparently facilitated the slip of β-Sn and stress release under shear stress to some extent.
  • Keywords
    copper alloys; differential scanning calorimetry; eutectic alloys; shearing; silver alloys; solders; solidification; tin alloys; Ag3Sn; Cu6Sn5; DSC instrument; Pb; Sn-Ag-Pb; Sn3.0Ag0.5Cu; backward compatible solder joints; differential scanning calorimetry; lead contamination; low melting temperature; shear stress; solder matrix; solidification; ternary eutectic alloy; Contamination; Joints; Lead; Microstructure; Reliability; Soldering; backward compatible; shear properties; solder joint; solidification behavior;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
  • Conference_Location
    Suzhou
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4799-1241-4
  • Type

    conf

  • DOI
    10.1109/IPFA.2013.6599239
  • Filename
    6599239