Title :
A new symbolic approach for testability measurement of analog networks
Author :
Catelani, M. ; Fedi, G. ; Luchetta, A. ; Manetti, S. ; Marini, M. ; Piccirilli, M.C.
Author_Institution :
Florence Univ., Italy
Abstract :
A new approach for testability measurement of analog networks is presented. It is based on the use of symbolic techniques, that allow us to realize very simple testability evaluation algorithms. The new method presents noteworthy advantages from a computational point of view with respect to previous symbolic techniques of testability measurement developed by the authors in the past. In fact it does not require the computation of the sensitivities of the network functions, but it is based only on the study of the network function symbolic coefficients. A new theorem has been proved and the subsequent new algorithm permits to completely eliminate the roundoff errors and increase the computing speed. A brief introduction to the program which implements this new algorithm is also presented
Keywords :
Jacobian matrices; active networks; analogue circuits; circuit analysis computing; circuit testing; computational complexity; design for testability; fault diagnosis; symbol manipulation; Jacobian matrix; SAPEC program; analog networks; band pass active circuit; computing speed; design for testability; fault diagnosis; network function symbolic coefficients; roundoff errors elimination; simple testability evaluation algorithms; symbolic approach; testability measurement; Circuit faults; Circuit testing; Differential equations; Fault diagnosis; Roundoff errors; Vectors;
Conference_Titel :
Electrotechnical Conference, 1996. MELECON '96., 8th Mediterranean
Conference_Location :
Bari
Print_ISBN :
0-7803-3109-5
DOI :
10.1109/MELCON.1996.551592