DocumentCode :
3039462
Title :
The application of fault tree analysis method in electrical component
Author :
Chen, Yuanfeng ; He, X.Q. ; Lai, P.
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Res. Inst. of Minist. of Ind. & Inf. Technol., Guangzhou, China
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
658
Lastpage :
661
Abstract :
Fault tree analysis is a method which is widely used in analysis and forecasting system security and reliability. This analysis method is also applicable for reliability analysis of components. It is first time in domestic to apply FTA techniques to electronic components in this paper. It also introduced the fault tree analysis method for electronic components in detail, including fault tree artificial construction method, qualitative analysis and quantitative analysis methods, which took the failure mode “short” for semiconductor device as an example. According to fault tree analysis for electronic components, it can identify possible failure causes, analyze the major failure causes and present corresponding measures to prevent component failure.
Keywords :
fault trees; semiconductor device reliability; FTA technique; component reliability analysis; electrical component; failure cause identification; failure mode; fault tree analysis method; fault tree artificial construction method; forecasting system reliability; forecasting system security; qualitative analysis method; quantitative analysis method; semiconductor device; Decision support systems; Failure analysis; Fault trees; Integrated circuits; Reliability; Safety; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
ISSN :
1946-1542
Print_ISBN :
978-1-4799-1241-4
Type :
conf
DOI :
10.1109/IPFA.2013.6599246
Filename :
6599246
Link To Document :
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