DocumentCode
3039623
Title
Behavior of electronically conductive filled adhesive joints under cyclic loading. I. Experimental approach
Author
Gomatam, Rajesh ; Sancaktar, Erol ; Boismier, Dennis ; Schue, Daniel ; Malik, Idan
Author_Institution
Dept. of Polymer Eng., Akron Univ., OH, USA
fYear
2001
fDate
2001
Firstpage
6
Lastpage
12
Abstract
Electronically conductive adhesives have received a great deal of attention in recent years for interconnection applications. Although they have great potential for being a more efficient and less costly alternative to solder joining in electronic components, there are still a number of problems in the areas of durability and design to meet specific needs. Unfortunately, the usefulness of this technique has been limited due to lack of understanding of environmental effects such as exposure to high moisture and/or temperature during mechanical fatigue loading, as faced in the service environment. Furthermore, the environmental effects mentioned may, themselves be acting in cyclic form. The objective of this paper is to add to the fundamental understanding of fatigue degradation in these joints, and to identify the dominant fatigue mechanisms for different service environment regimes, including cyclic mechanical loading under elevated temperature, and humidity. The scope of this study involves in-depth analysis and assessment of fatigue mechanisms and fatigue modes for a wide variety of parameters, i.e. humidity, temperature, pre-conditioning, stress ratio, and frequency. Failure surfaces are examined to identify degradation mechanisms in the adhesive interlayer by optical and SEM techniques. Measurements and observations are related to damage processes, failure modes, and the results are assessed with respect to the relevance of existing failure theories and criteria. It is expected that much improved fatigue life, fail-safe capability, and reduced manufacturing costs will be realized for electronically conductive adhesives
Keywords
adhesives; assembling; conducting polymers; environmental degradation; failure analysis; fatigue; filled polymers; integrated circuit interconnections; integrated circuit packaging; internal stresses; moisture; scanning electron microscopy; thermal stresses; SEM; adhesive interlayer; conductive adhesives; cyclic environmental effects; cyclic loading; cyclic mechanical loading; damage processes; degradation mechanisms; design; dominant fatigue mechanisms; durability; electronic components; electronically conductive adhesives; electronically conductive filled adhesive joints; elevated temperature environment; environmental effects; fail-safe capability; failure modes; failure surfaces; failure theories; fatigue degradation; fatigue life; fatigue mechanisms; fatigue modes; humidity; interconnection applications; manufacturing costs; mechanical fatigue loading; moisture; optical techniques; pre-conditioning; service environment; service environment regimes; solder joining; stress ratio; temperature effects; Conductive adhesives; Degradation; Electronic components; Fatigue; Frequency; Humidity; Manufacturing; Moisture; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location
Braselton, GA
Print_ISBN
0-930815-64-5
Type
conf
DOI
10.1109/ISAOM.2001.916540
Filename
916540
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