• DocumentCode
    3039684
  • Title

    Interconnection technique of ALIVH(R) substrate

  • Author

    Suzuki, T. ; Tomekawa, S. ; Ogawa, T. ; Andoh, D. ; Tanahashi, M. ; Ishida, T.

  • Author_Institution
    Device Eng. Dev. Center, Matsushita Electr. Ind. Co. Ltd., Kadoma, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    23
  • Lastpage
    28
  • Abstract
    The unique interconnection using conductive paste of the ALIVH(R) (any layer interstitial via hole) substrate, especially its structure, was studied. Calculations and SEM images suggested the existence of metallic bonding between copper particles and between copper particles and copper foil. By assuming that metallic bonds exist, interconnection resistance variation with temperature could be explained. We also studied a considerable number of factors for obtaining strong interconnection. As a consequence, the compression and the binder system of the conductive paste play important roles in achieving strong interconnection
  • Keywords
    adhesives; bonds (chemical); conducting polymers; electric resistance; integrated circuit interconnections; integrated circuit packaging; printed circuits; scanning electron microscopy; thermal stability; ALIVH structure; ALIVH substrate; Cu; SEM images; any layer interstitial via hole substrate; conductive paste; conductive paste binder system; conductive paste compression; copper particle bonding; copper particle/copper foil bonding; interconnection; interconnection resistance variation; interconnection technique; metallic bonding; metallic bonds; Bonding; Chip scale packaging; Copper; Dielectric constant; Flowcharts; Integrated circuit interconnections; Manufacturing processes; Substrates; Temperature; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-64-5
  • Type

    conf

  • DOI
    10.1109/ISAOM.2001.916543
  • Filename
    916543