Dynamic behavior of SRAM data retention and a novel transient voltage collapse technique for 0.6V 32nm LP SRAM

A novel transient voltage collapse (TVC) technique is presented to enable low-voltage operation in SRAM. By dynamically switching off the PMOS during write operations with a collapsed supply voltage below the data retention voltage, a minimum operating voltage (V_ccmin) of 0.6V is demonstrated in a 32nm 12-Mb low-power (LP) SRAM. Data retention failure of unselected cells is mitigated by controlling the duration of voltage collapse. Circuit-process co-optimization is critical to ensure robust circuit design margin of TVC technique.