• DocumentCode
    3039994
  • Title

    Lead free alloys for flip chip bumping

  • Author

    Jung, E. ; Aschenbrenner, R. ; Kallmayer, Ch ; Coskina, P. ; Reichl, H.

  • Author_Institution
    Dept. of Chip Interconnection Technol. & Adv. Packages, Fraunhofer-Inst. FhG/IZM, Berlin, Germany
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    In addition to the ecological and electrical aspects of area array packages, there is a need to develop new solders with similar process characteristics and usage cost to Pb/Sn solders, but which are lead free and have improved mechanical properties and microstructural stability. As operating temperatures increase, standard alloys are unable to withstand the increased fatigue caused by the thermal cycling. Current lead-tin solders lack shear strength, creep resistance and thermal mechanical fatigue resistance. A solder which exhibits enhancements of these properties is crucial in automotive and other high-reliability products and high-temperature assemblies. In electronic packaging, it is common practice to solder the various levels of the package with different solders of different melting points so that the soldering of each successive level or step does not remelt the previously soldered joints. Depending on the particular applications, the most suitable solder alloys for area array packages (flip chip, CSP, BGA) are presented in this paper. Initial reliability results are also given
  • Keywords
    automotive electronics; chip scale packaging; creep; environmental factors; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; melting point; microassembling; shear strength; soldering; thermal stability; thermal stress cracking; AuSn; BGA; CSP; Pb; Pb/Sn solders; SnAg; SnBiCu; SnCu; SnPb; area array packages; automotive products; creep resistance; electronic packaging; fatigue; flip chip bumping; high-reliability products; high-temperature assemblies; lead free solder alloys; lead free solders; mechanical properties; microstructural stability; operating temperatures; package levels; reliability; shear strength; solder alloys; solder melting points; solder process characteristics; solder usage cost; soldered joint remelting; thermal cycling; thermal mechanical fatigue resistance; Costs; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fatigue; Flip chip; Lead; Mechanical factors; Stability; Thermal resistance; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-64-5
  • Type

    conf

  • DOI
    10.1109/ISAOM.2001.916560
  • Filename
    916560