Title :
Reliability of 10Gb/s 850nm oxide confined vertical cavity surface emitting lasers
Author :
Meng Haijie ; Zhang Zhenfeng ; Wang Shancheng ; Ding Guoqing ; Zhou Zhonghua
Author_Institution :
Wuhan Huagong Genuine Opt. Technol. Co., Ltd., Huazhong Univ. of Sci. & Technol. Region, Wuhan, China
Abstract :
High temperature operating life test was used to evaluate the reliability of 10Gb/s 850nm Oxide Confined Vertical Cavity Surface Emitting Lasers(VCSELs) provided by Oclaro Inc. Two kinds of failure phenomenons encountered during the experiment were studied and the possible failure mechanisms were given.
Keywords :
failure analysis; laser reliability; life testing; surface emitting lasers; Oclaro Inc; VCSEL; bit rate 10 Gbit/s; failure mechanisms; high temperature operating life test; oxide confined vertical cavity surface emitting lasers; reliability; size 850 nm; Decision support systems; Failure analysis; Integrated circuits;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1241-4
DOI :
10.1109/IPFA.2013.6599271
