DocumentCode :
3040103
Title :
Ultra-HDI with low cost photo-imageable polymers
Author :
Fuhan Liu ; Sundaram, Venky ; White, George ; Sutter, Dean ; Tummala, Rao R.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
2001
Firstpage :
153
Lastpage :
158
Abstract :
As IC devices continue to drive to finer and finer feature sizes, so must the packaging to support them. High-density-interconnects (HDI) fabricated on low cost organic laminates is widely regarded as a critical enabler for device and wafer level packaging. System-on-a-package (SOP) is rapidly being accepted as the future means by which ICs and other components will be packaged. However, if SOP is to be successful, low cost materials and processes must be optimized to reliably yield fine line structures. The PRC has been working to meet a number of challenges that confront the successful implementation of SOP. One of those challenges manifests itself in the area of fine line lithography. Here, low cost photoresists and photo-imageable polymer materials are being evaluated. In addition, processes to support these materials must be optimized for developing ultra fine line HDI substrates. Line widths and spaces of 10-15 μm and microvia diameters of 25-50 μm have been achieved on large area organic laminates. This paper discusses a number of critical process and material issues that may affect the integrity of fine line and microvia formation
Keywords :
fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; laminates; optical polymers; optimisation; photoresists; polymer films; printed circuit manufacture; 10 to 15 micron; 25 to 50 micron; HDI; IC devices; SOP; SOP implementation; cost optimization; device level packaging; feature size; fine line formation; fine line lithography; fine line structures; high-density-interconnects; large area organic laminates; line spacing; line width; material cost; microvia formation; organic laminates; packaging; photo-imageable polymer materials; photo-imageable polymers; photoresists; process cost; system-on-a-package; ultra fine line HDI substrates; ultra-HDI; wafer level packaging; Additives; Costs; Flip chip; Laminates; Microelectronics; Packaging; Partial response channels; Polymers; Resists; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
Type :
conf
DOI :
10.1109/ISAOM.2001.916567
Filename :
916567
Link To Document :
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