DocumentCode
3040133
Title
Large-signal mm-wave InAlN/GaN HEMT power amplifier characterization through self-consistent Harmonic Balance / Cellular Monte Carlo device simulation
Author
Guerra, D. ; Marino, F.A. ; Ferry, D.K. ; Goodnick, S.M. ; Saraniti, M. ; Soligo, R.
Author_Institution
Center for Comput. Nanosci., Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
5-7 Dec. 2011
Abstract
We report the simulation of the large-signal performance of mm-wave FET power amplifiers obtained for the first time through Full Band Monte Carlo particle-based device simulation self-consistently coupled with a Harmonic Balance (HB) frequency domain circuit solver. Due to the iterative nature of the HB algorithm, this FET simulation approach is possible only due to the computational efficiency of our Cellular Monte Carlo (CMC), which uses pre-computed scattering tables. On the other hand, a frequency domain circuit solver such as HB allows the simulation of the steady-state behavior of an external passive reactive network without the need for simulating long transient time (i.e. RC, L/C time constants) typical of time domain solutions. By exploiting this newly developed self-consistent CMC/HB code, we were able to time-efficiently characterize the mm-wave power performance of a state-of-the-art 30-nm gate-length InAlN/GaN HEMT.
Keywords
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; millimetre wave amplifiers; power amplifiers; wide band gap semiconductors; InAlN-GaN; cellular Monte Carlo device simulation; frequency domain circuit solver; large-signal mm-wave HEMT power amplifier; self-consistent harmonic balance; Harmonic analysis; Integrated circuit modeling; Logic gates; Monte Carlo methods; Performance evaluation; Power amplifiers; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location
Washington, DC
ISSN
0163-1918
Print_ISBN
978-1-4577-0506-9
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2011.6131668
Filename
6131668
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