• DocumentCode
    3040133
  • Title

    Large-signal mm-wave InAlN/GaN HEMT power amplifier characterization through self-consistent Harmonic Balance / Cellular Monte Carlo device simulation

  • Author

    Guerra, D. ; Marino, F.A. ; Ferry, D.K. ; Goodnick, S.M. ; Saraniti, M. ; Soligo, R.

  • Author_Institution
    Center for Comput. Nanosci., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    5-7 Dec. 2011
  • Abstract
    We report the simulation of the large-signal performance of mm-wave FET power amplifiers obtained for the first time through Full Band Monte Carlo particle-based device simulation self-consistently coupled with a Harmonic Balance (HB) frequency domain circuit solver. Due to the iterative nature of the HB algorithm, this FET simulation approach is possible only due to the computational efficiency of our Cellular Monte Carlo (CMC), which uses pre-computed scattering tables. On the other hand, a frequency domain circuit solver such as HB allows the simulation of the steady-state behavior of an external passive reactive network without the need for simulating long transient time (i.e. RC, L/C time constants) typical of time domain solutions. By exploiting this newly developed self-consistent CMC/HB code, we were able to time-efficiently characterize the mm-wave power performance of a state-of-the-art 30-nm gate-length InAlN/GaN HEMT.
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; millimetre wave amplifiers; power amplifiers; wide band gap semiconductors; InAlN-GaN; cellular Monte Carlo device simulation; frequency domain circuit solver; large-signal mm-wave HEMT power amplifier; self-consistent harmonic balance; Harmonic analysis; Integrated circuit modeling; Logic gates; Monte Carlo methods; Performance evaluation; Power amplifiers; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2011 IEEE International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4577-0506-9
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2011.6131668
  • Filename
    6131668