• DocumentCode
    3040169
  • Title

    Integrated “turn-key” flip chip capability in assembly subcontracting

  • Author

    Kim, P.G. ; Berry, C.J. ; Mescher, P. ; Thompson, L. ; Groover, R.

  • Author_Institution
    Amkor Technol., Chandler, AZ, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    180
  • Lastpage
    185
  • Abstract
    Large captive companies have successfully run flip chip programs for years, but expansion of the merchant flip chip market has been limited in large part by the maturity of the sub-contractor infrastructure. This is changing rapidly due to the emergence of several merchant flip chip suppliers that are now running manufacturing volumes. Arguably, the success of these programs will be dependent on their ability to integrate bumping and assembly to produce high yielding/quality products in minimum cycle times. This paper reviews the integrated flip chip capability at Amkor Technology, the paste and electroplated bumping processes in use, and resulting reliability performance of three key FCBGA packages. Wafer bumping and substrate design rules are also discussed as they present opportunities for package cost reduction
  • Keywords
    ball grid arrays; electroplating; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microassembling; outsourcing; FCBGA packages; assembly subcontracting; bumping/assembly integration; electroplated bumping process; flip chip; flip chip programs; integrated flip chip capability; integrated turn-key flip chip capability; manufacturing volumes; merchant flip chip market; merchant flip chip suppliers; package cost reduction; paste bumping process; product quality; product yield; reliability performance; sub-contractor infrastructure; substrate design rules; wafer bumping; Assembly; Flip chip; Lead; Packaging; Production facilities; Sputter etching; Subcontracting; Testing; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-64-5
  • Type

    conf

  • DOI
    10.1109/ISAOM.2001.916572
  • Filename
    916572