DocumentCode :
3040446
Title :
Syntheses and characterizations of a controlled thermally degradable epoxy resin system for electronic packaging
Author :
Li, Haiying ; Wang, Lejun ; Wong, C.P.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
2001
Firstpage :
268
Lastpage :
274
Abstract :
In flip-chip technology, reworkable underfill development has been key to the recovery of highly integrated board assembly designs by replacing defective chips. This paper reports the synthesis, formulation and characterization of two new diepoxides containing secondary and tertiary ester linkages that are thermally degradable below 300°C. The secondary and tertiary ester diepoxides were synthesized in three and two steps, respectively. The compounds were characterized via NMR and FTIR spectroscopy, and formulated into underfills with anhydride hardener and imidazole catalyst. A dual-epoxy system was also formulated using tertiary ester diepoxide and an aliphatic diepoxide, ERG-4221E, with the same hardener and catalyst. The curing kinetics were studied by DSC. Thermal properties of cured samples were studied by DSC, TGA and thermomechanical analysis (TMA). The dual-epoxy system showed a viscosity of 18.7, and 0.87 Poise at 25°C and 190°C, respectively. The cured secondary, tertiary and dual-epoxy formulas showed decomposition temperatures around 265°C, 190°C and 220°C, glass transition temperatures (Tg) around 120-140°C, 110-157°C and 140-157°C, and CTE of 70 ppm/°C, 72 ppm/°C and 64 ppm/°C below their Tg, respectively. The shear strength of the cured dual-epoxy system decreased quickly upon being aged at 230°C. Reworkability tests showed that removal from the board of a chip underfilled with this material was easy and the board residue could be removed with a mechanical brush without obvious damage to the solder mask. In summary, the synthesized tertiary epoxide can be used as a reworkable underfill for flip-chip applications
Keywords :
Fourier transform spectra; NMR spectroscopy; catalysts; differential scanning calorimetry; encapsulation; flip-chip devices; glass transition; integrated circuit packaging; polymer blends; polymers; pyrolysis; shear strength; thermal analysis; thermal expansion; viscosity; 100 C; 110 to 157 C; 120 to 140 C; 140 to 157 C; 190 C; 220 C; 230 C; 25 C; 265 C; CTE; DSC; FTIR spectroscopy; NMR spectroscopy; TGA; TMA; ageing; aliphatic diepoxide; anhydride hardener; board residue; chip removal; chip underfill; controlled thermally degradable epoxy resin system; cured diepoxides; cured dual-epoxy system; curing kinetics; decomposition temperatures; defective chip replacement; diepoxide synthesis; diepoxides; dual-epoxy system; electronic packaging; flip-chip applications; flip-chip technology; glass transition temperatures; highly integrated board assembly design recovery; imidazole catalyst; mechanical brush; reworkability tests; reworkable underfill; secondary ester diepoxides; secondary ester linkages; shear strength; solder mask; tertiary ester diepoxides; tertiary ester linkages; thermal properties; thermally degradable diepoxides; thermomechanical analysis; viscosity; Assembly; Couplings; Curing; Kinetic theory; Nuclear magnetic resonance; Spectroscopy; Temperature; Thermal degradation; Thermomechanical processes; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
Type :
conf
DOI :
10.1109/ISAOM.2001.916587
Filename :
916587
Link To Document :
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