DocumentCode :
3040513
Title :
Application of photoelastic microscopy for researches in MEMS technology and photonics
Author :
Oliinyk, O. ; Tsyganok, B. ; Serdega, B. ; Matiash, I.
Author_Institution :
Dept. of Electron. Devices & Equipments, NationalTechnical Univ. of Ukraine KPI, Kiev, Ukraine
fYear :
2012
fDate :
9-13 May 2012
Firstpage :
224
Lastpage :
229
Abstract :
This paper is devoted to the principles of modulation-polarization microscopy applied to surface and volume structures of solid-state materials of electronics, photonics and bioelectronics. A new setup of modulation-polarization microscope is introduced; its main advantages are speed, interference immunity, high detectivity, cheapness and simplicity of implementation. Presented method and preliminary results confirm the usability of the new photoelastic microscope for research and development of MEMS devices; micro-nano control and processing of crystal, polymers and metals surfaces and transparent volumes.
Keywords :
micro-optics; micromechanical devices; nanophotonics; near-field scanning optical microscopy; photoelasticity; MEMS technology; bioelectronics; interference immunity; micro-nano control; modulation polarization microscopy; photoelastic microscopy; photonics; solid state materials; volume structures; Measurement by laser beam; Microscopy; Optical imaging; Optical microscopy; Optical modulation; Optical polarization; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2012 35th International Spring Seminar on
Conference_Location :
Bad Aussee
ISSN :
2161-2528
Print_ISBN :
978-1-4673-2241-6
Electronic_ISBN :
2161-2528
Type :
conf
DOI :
10.1109/ISSE.2012.6273077
Filename :
6273077
Link To Document :
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