Title :
RF electrical simulation of embedded capacitor
Author :
Rao, Yang ; Qu, Jianmin ; Wong, C.P.
Author_Institution :
Package Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Embedded passives have many advantages, such as: improving packaging efficiency and electrical performance, reducing the use of PWB real estate, eliminating assembly to board, minimizing solder joint failure and enhanced reliability. The trend of miniaturisation of electronic products requires use of embedded passive technology. The design of embedded passives is very important to its practical application. However, there is still no mature commercial computer aided design (CAD) tool available for embedded passive design. The objective of this research is to conduct computer simulation and modeling for embedded capacitors and resistors. The commercial finite element software ANSYS and electric simulation software SPICE were used for the modeling work, which includes electric and thermo-mechanical analyses, the frequency response simulation, and the electric interference prediction of embedded capacitor and resistors. Attention was paid to the effects of material properties and the geometry of the embedded passives. The finite-element method (FEM) model and SPICE simulation provide a good picture of the distribution, electric performance and tolerance of embedded passives. As such, FEM and SPICE are very helpful for the design and manufacture process
Keywords :
SPICE; buried layers; capacitors; circuit reliability; electronic design automation; finite element analysis; frequency response; microwave devices; packaging; resistors; ANSYS finite element software; CAD tool; FEM; PWB real estate; RF electrical simulation; SPICE; SPICE electric simulation software; SPICE simulation; assembly to board elimination; computer aided design tool; computer simulation; device distribution; electric interference prediction; electric performance; electrical performance; electronic products; embedded capacitor; embedded capacitors; embedded passive design; embedded passive technology; embedded passives; embedded resistors; finite-element method model; frequency response simulation; material properties; miniaturisation; modeling; packaging efficiency; reliability; solder joint failure minimization; thermo-mechanical analysis; tolerance; Analytical models; Capacitors; Computational modeling; Electronics packaging; Embedded software; Finite element methods; Predictive models; Radio frequency; Resistors; SPICE;
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
DOI :
10.1109/ISAOM.2001.916590