DocumentCode :
3040611
Title :
The effect of toughening of no-flow underfill on fillet cracking of flip-chip device
Author :
Moon, Kyoung-Sik ; Fan, Lianhua ; Wong, C.P.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
2001
Firstpage :
333
Lastpage :
340
Abstract :
The effect of toughening agents and modification of epoxy on fillet cracking was investigated. Nylon, polycarbonate (PC) and polysiloxanes with amine and epoxy functional groups were employed as the toughening agents. Nylon and PC were miscible and reacted with epoxy resin, and a homogenous phase was found. However, Nylon and PC were ineffective in enhancing the anti-fillet cracking properties of the no-flow underfill. In the case where the epoxy was modified with polysiloxanes, a second phase with fine particle size was formed and the particle size depended on the toughening agent. The morphology was observed by scanning electron microscopy (SEM) and confirmed by dynamic mechanical analysis (DMA) measurement. The physical properties such as the fracture toughness, flexural modulus, coefficient of thermal expansion (CTE), and adhesion were measured and liquid-liquid thermal shock (LLTS) tests in the -55~125°C range were performed with different formulations. One of the formulations toughened by amine/epoxy terminated polysiloxane, which has higher die shear strength, lower modulus, and higher toughness, passed 1000 cycles of the LLTS test. As such, in order to obtain highly reliable no-flow underfill, the physical properties of the no-flow underfill should be well controlled and balanced. Finally, correlation between physical properties of no-flow underfill and anti-fillet cracking capability for these approaches was discussed
Keywords :
adhesion; cracks; elastic moduli; encapsulation; flip-chip devices; fracture toughness; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; particle size; polymer films; scanning electron microscopy; shear strength; thermal expansion; thermal shock; -55 to 125 C; CTE; DMA; LLTS test; Nylon toughening agents; SEM; adhesion; amine functional groups; amine/epoxy terminated polysiloxane; anti-fillet cracking capability; anti-fillet cracking properties; coefficient of thermal expansion; die shear strength; dynamic mechanical analysis; epoxy functional groups; epoxy modification; epoxy resin reaction; fillet cracking; flexural modulus; flip-chip device; fracture toughness; homogenous phase; liquid-liquid thermal shock test; modulus; morphology; no-flow underfill; particle size; physical properties; polycarbonate toughening agents; polysiloxane modified epoxy; polysiloxane toughening agents; reliable no-flow underfill; scanning electron microscopy; toughening; toughening agents; toughness; Adhesives; Electric shock; Electronic packaging thermal management; Epoxy resins; Materials science and technology; Mechanical variables measurement; Moon; Scanning electron microscopy; Testing; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
Type :
conf
DOI :
10.1109/ISAOM.2001.916598
Filename :
916598
Link To Document :
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