• DocumentCode
    3040611
  • Title

    The effect of toughening of no-flow underfill on fillet cracking of flip-chip device

  • Author

    Moon, Kyoung-Sik ; Fan, Lianhua ; Wong, C.P.

  • Author_Institution
    Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    333
  • Lastpage
    340
  • Abstract
    The effect of toughening agents and modification of epoxy on fillet cracking was investigated. Nylon, polycarbonate (PC) and polysiloxanes with amine and epoxy functional groups were employed as the toughening agents. Nylon and PC were miscible and reacted with epoxy resin, and a homogenous phase was found. However, Nylon and PC were ineffective in enhancing the anti-fillet cracking properties of the no-flow underfill. In the case where the epoxy was modified with polysiloxanes, a second phase with fine particle size was formed and the particle size depended on the toughening agent. The morphology was observed by scanning electron microscopy (SEM) and confirmed by dynamic mechanical analysis (DMA) measurement. The physical properties such as the fracture toughness, flexural modulus, coefficient of thermal expansion (CTE), and adhesion were measured and liquid-liquid thermal shock (LLTS) tests in the -55~125°C range were performed with different formulations. One of the formulations toughened by amine/epoxy terminated polysiloxane, which has higher die shear strength, lower modulus, and higher toughness, passed 1000 cycles of the LLTS test. As such, in order to obtain highly reliable no-flow underfill, the physical properties of the no-flow underfill should be well controlled and balanced. Finally, correlation between physical properties of no-flow underfill and anti-fillet cracking capability for these approaches was discussed
  • Keywords
    adhesion; cracks; elastic moduli; encapsulation; flip-chip devices; fracture toughness; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; particle size; polymer films; scanning electron microscopy; shear strength; thermal expansion; thermal shock; -55 to 125 C; CTE; DMA; LLTS test; Nylon toughening agents; SEM; adhesion; amine functional groups; amine/epoxy terminated polysiloxane; anti-fillet cracking capability; anti-fillet cracking properties; coefficient of thermal expansion; die shear strength; dynamic mechanical analysis; epoxy functional groups; epoxy modification; epoxy resin reaction; fillet cracking; flexural modulus; flip-chip device; fracture toughness; homogenous phase; liquid-liquid thermal shock test; modulus; morphology; no-flow underfill; particle size; physical properties; polycarbonate toughening agents; polysiloxane modified epoxy; polysiloxane toughening agents; reliable no-flow underfill; scanning electron microscopy; toughening; toughening agents; toughness; Adhesives; Electric shock; Electronic packaging thermal management; Epoxy resins; Materials science and technology; Mechanical variables measurement; Moon; Scanning electron microscopy; Testing; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-64-5
  • Type

    conf

  • DOI
    10.1109/ISAOM.2001.916598
  • Filename
    916598