Title :
Congruence Transformation Invariant Feature Descriptor for Robust 2D Scan Matching
Author :
Nakamura, T. ; Tashita, Yuuichi
Author_Institution :
Fac. of Syst. Eng., Wakayama Univ., Wakayama, Japan
Abstract :
The ability of computing similarities between two data sets is a key for many applications such as video tracking, object recognition, image stitching, 3D modeling and so on. Recently, Lowe has discovered a promissing approach for matching 2D images based on the local invariant feature descriptor called SIFT [1]. We are really inspired by Lowe\´s method. In this paper, we propose a new local invariant feature descriptor for matching 2D scan data. The proposed feature descriptor is called "CIF", that is a feature which remains unchanged when a congruence transformation is applied. We can perform global scan matching in cluttered environments by matching an input scan with a reference scan based on CIF without any initial alignments. the validity of our method is confirmed by experiments in real environment.
Keywords :
Fourier transforms; image matching; 2D images; 2D scan data; 3D modeling; CIF; SIFT; cluttered environments; congruence transformation invariant feature descriptor; global scan matching; image stitching; local invariant feature descriptor; object recognition; reference scan; robust 2D scan matching; video tracking; Educational institutions; Feature extraction; Histograms; Impedance matching; Iterative closest point algorithm; Mobile robots; Robustness; Global scan matching; Invariant feature descriptor; Self localization and Map building;
Conference_Titel :
Systems, Man, and Cybernetics (SMC), 2013 IEEE International Conference on
Conference_Location :
Manchester
DOI :
10.1109/SMC.2013.284