Title :
Size reduction and harmonic suppression of parallel coupled-line bandpass filters using defected ground structure
Author :
Karshenas, F. ; Mallahzadeh, A.R. ; Rashed-Mohassel, J.
Author_Institution :
Fac. of Eng., Shahed Univ., Tehran
Abstract :
A novel miniaturized parallel coupled-line bandpass filter with suppression of second, third and fourth harmonic frequencies, is demonstrated in this paper. The new filter is based on the slow-wave effect of the defected ground structure (DGS) to achieve size minimization, while the spurious responses are eliminated by the band-rejection property. These features offer the classical parallel coupled-line bandpass filter simultaneous compactness and wide stopband performance. Using DGS does not require the filter parameters to be recalculated and, this way, the classical design methodology for coupled-line microstrip filters can still be used. The simulations and measurements of a 2.0 GHz prototype bandpass filter are presented. The measured results agree well with the simulation data. Compared with the conventional parallel coupled-line bandpass filters, the second, third and fourth measured spurious responses are suppressed to -45, -43 and -34 dB, respectively. In addition, the size of the prototype filter circuitry can be reduced up to 20%.
Keywords :
UHF filters; band-pass filters; microstrip filters; slow wave structures; band-rejection property; coupled-line microstrip filters; defected ground structure; frequency 2.0 GHz; miniaturized parallel coupled-line bandpass filter; slow-wave effect; stopband; Band pass filters; Circuit simulation; Coupling circuits; Design methodology; Frequency; Harmonics suppression; Microstrip filters; Minimization; Power harmonic filters; Virtual prototyping; bandpass filter; defected ground structure (DGS); multispurious suppression; size reduction;
Conference_Titel :
Antenna Technology and Applied Electromagnetics and the Canadian Radio Science Meeting, 2009. ANTEM/URSI 2009. 13th International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2979-0
Electronic_ISBN :
978-1-4244-2980-6
DOI :
10.1109/ANTEMURSI.2009.4805078