• DocumentCode
    3041345
  • Title

    Reliability investigation of low silver content micro-alloyed SAC solders

  • Author

    Krammer, Olivér ; Garami, Tamás

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2012
  • fDate
    9-13 May 2012
  • Firstpage
    149
  • Lastpage
    154
  • Abstract
    In our research, we performed comparative analyses concerning various lead-free SAC (SnAgCu) and micro-alloyed SAC (SnAgCu+Bi+Sb) solder alloys. The mechanical properties of these solder alloys were characterized by measuring the shear strength of 0603 (1.5 × 0.75 mm) size chip resistors´ joints. We designed a testboard, which contains fifty pieces of 0603 size resistors. Thirty of them are intended for shear strength measurements and the remaining twenty are intended for cross-sectional analyses. During the experiment, twenty-eight pieces of testboards were soldered (seven with each solder alloy) and twenty-four of them are subjected to Thermal-Shock life time tests with temperature range of +125°C - -40°C up to 2 000 cycles. The shear strength of the solder joints was measured on aged samples to examine their reliability as well. The detailed results are presented in the paper.
  • Keywords
    ageing; antimony alloys; bismuth alloys; copper alloys; life testing; reliability; resistors; shear strength; silver alloys; solders; thermal shock; tin alloys; SnAgCuBiSb; cross-sectional analysis; low silver content microalloyed SAC solders; mechanical properties; reliability; shear strength measurements; size chip resistor joints; solder alloys; solder joints; temperature 125 degC to -40 degC; thermal-shock life time tests; Electric shock; Intermetallic; Resistors; Silver; Soldering; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2012 35th International Spring Seminar on
  • Conference_Location
    Bad Aussee
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4673-2241-6
  • Electronic_ISBN
    2161-2528
  • Type

    conf

  • DOI
    10.1109/ISSE.2012.6273126
  • Filename
    6273126