Title :
A proposed ATE for digital systems
Author :
Saad, E.M. ; Talkhan, I.E. ; Sayed, I.M.
Author_Institution :
Fac. of Eng., Helwan Univ., Cairo, Egypt
Abstract :
An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis
Keywords :
automatic test equipment; automatic test software; fault diagnosis; fault location; ATE; board partitioning; digital system testing; fault detection; fault diagnosis; faulty part localisation; hierarchical testing; software programs; system partitioning; test models; test packages; test simulation; test system; Automatic testing; Circuit testing; Control systems; Data acquisition; Digital systems; Displays; Performance evaluation; Signal generators; Software testing; System testing;
Conference_Titel :
Radio Science Conference, 1996. NRSC '96., Thirteenth National
Conference_Location :
Cairo
Print_ISBN :
0-7803-3656-9
DOI :
10.1109/NRSC.1996.551113
