DocumentCode
3041472
Title
A proposed ATE for digital systems
Author
Saad, E.M. ; Talkhan, I.E. ; Sayed, I.M.
Author_Institution
Fac. of Eng., Helwan Univ., Cairo, Egypt
fYear
1996
fDate
19-21 Mar 1996
Firstpage
209
Lastpage
220
Abstract
An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis
Keywords
automatic test equipment; automatic test software; fault diagnosis; fault location; ATE; board partitioning; digital system testing; fault detection; fault diagnosis; faulty part localisation; hierarchical testing; software programs; system partitioning; test models; test packages; test simulation; test system; Automatic testing; Circuit testing; Control systems; Data acquisition; Digital systems; Displays; Performance evaluation; Signal generators; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Conference, 1996. NRSC '96., Thirteenth National
Conference_Location
Cairo
Print_ISBN
0-7803-3656-9
Type
conf
DOI
10.1109/NRSC.1996.551113
Filename
551113
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