DocumentCode
3041580
Title
Quantitative analysis of X-ray fluorescence without standard reference samples
Author
Ji, Zhenguo ; Liang, Xiaoyong ; Xi, Junhua
Author_Institution
Coll. of Mater. & Environ. Eng., Hangzhou Dianzi Univ., Hangzhou, China
fYear
2011
fDate
26-28 July 2011
Firstpage
5970
Lastpage
5972
Abstract
X-ray fluorescence (XRF) is a non-destructive technique for elemental analysis. But the accuracy of the quantitative analysis of XRF is not as good as other techniques due to the matrix effects. In this paper, we proposed a new method by making the bulk samples into thin films with proper thickness to reduce the matrix effect, and taking into account of bremsstrahlung radiation as part of the incident X-ray intensity.
Keywords
II-VI semiconductors; X-ray fluorescence analysis; bremsstrahlung; cadmium compounds; fluorescence; semiconductor thin films; wide band gap semiconductors; CdTe; X-ray fluorescence; XRF; bremsstrahlung radiation; elemental analysis; incident X-ray intensity; matrix effect; nondestructive method; thin films; Argon; Bismuth; Films; Fluorescence; Silicon; Solids; Matrix effect; Thin films; XRF; bremsstrahlung;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia Technology (ICMT), 2011 International Conference on
Conference_Location
Hangzhou
Print_ISBN
978-1-61284-771-9
Type
conf
DOI
10.1109/ICMT.2011.6002641
Filename
6002641
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