DocumentCode :
3042246
Title :
New Zener Diode Structure Between Base and the Collector Using Retrograded Profile
Author :
Park, K.
Author_Institution :
Fairchild Korea Semicond. Ltd., Bucheon
fYear :
2004
fDate :
8-10 Dec. 2004
Firstpage :
125
Lastpage :
128
Abstract :
A new Zener diode structure for bipolar transistor is proposed and analyzed. By placing the Zener diode at junction termination, we could obtain stable clamped breakdown voltage without deterioration of device performance. P+ layer of the Zener diode is embedded with base of transistor simultaneously so that whole functional behaviors of the composite transistor could be realized with relatively simple process. The breakdown voltage of the Zener diode is controlled only by adjusting of the phosphorus implantation dose. The breakdown voltage distribution of the fabricated Zener diode is less than ±4%. The BVCBO and BVCEO of bipolar transistors are about 50 V, same as the breakdown voltage of Zener diodes. And the DC current gain is 300 at VCE=2 V and IC=0.5 A
Keywords :
Zener diodes; Zener effect; bipolar transistors; ion implantation; phosphorus; 0.5 A; 2 V; Zener diode; bipolar transistor; breakdown voltage; phosphorus implantation dose; retrograded profile; Anodes; Bipolar transistors; Circuits; Clamps; Costs; Electric variables; Protection; Resistors; Semiconductor diodes; Voltage control; bipolar transistor; retrograded profile; zener diode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2004 Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-8820-8
Type :
conf
DOI :
10.1109/COMMAD.2004.1577508
Filename :
1577508
Link To Document :
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