DocumentCode :
3042315
Title :
Guidelines for statistically based sampling reduction
Author :
Pepper, Dwayne
Author_Institution :
Sematech, Austin, TX, USA
fYear :
1994
fDate :
12-14 Sep 1994
Firstpage :
216
Abstract :
Presented are general guidelines, with examples, for sample reduction and monitor elimination in a high-volume manufacturing environment. Although statistical soundness is never overlooked, this focus on sampling is from a practical point of view. That is, can we have this level of sampling indefinitely and still run a profitable operation? Examples are taken from a factory where comprehensive sample reduction has led to substantial cost savings
Keywords :
batch processing (industrial); economics; statistical analysis; cost savings; factory; high-volume manufacturing environment; monitor elimination; profitable operation; statistically based sampling reduction; Condition monitoring; Cost benefit analysis; Electronics industry; Extrapolation; Fabrication; Guidelines; Manufacturing; Metrology; Production facilities; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1994. Low-Cost Manufacturing Technologies for Tomorrow's Global Economy. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International
Conference_Location :
La Jolla, CA
Print_ISBN :
0-7803-2037-9
Type :
conf
DOI :
10.1109/IEMT.1994.404710
Filename :
404710
Link To Document :
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